Oliver Schilter, Alain Vaucher, et al.
Digital Discovery
Dhdelectric characteristics were determined for a microstructurally anisotropic borosilicate glass prepared by uniaxiallhd stretching phase‐separated glass rods. The specimen showed a dielectric loss peak caused by the inhomogeneous microstructure; its magnitude varied with the orientation of the specimen with respect to the electric field direction. The results are in agreement with Sillars’ theory. Copyright © 1981, Wiley Blackwell. All rights reserved
Oliver Schilter, Alain Vaucher, et al.
Digital Discovery
A. Gangulee, F.M. D'Heurle
Thin Solid Films
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Chemistry of Materials
Sang-Min Park, Mark P. Stoykovich, et al.
Advanced Materials