Ehud Altman, Kenneth R. Brown, et al.
PRX Quantum
Lately our vernacular has included a growing number of DFx terms. DFT (Design for Test), DFY (Design for Yield), and DFR (Design for Reliability) have become fairly common and useful terms along with a few other DFx terms such as DFM (Design for Manufacturability) and DFP (Design for Profit). The last term has a bit of a capitalistic slant. One could say that we have gone too far with all these terms. This short paper includes a discussion of circuit level DFT followed by an explanation of why DFT is more important to me as an ASIC test developer.
Ehud Altman, Kenneth R. Brown, et al.
PRX Quantum
R.B. Morris, Y. Tsuji, et al.
International Journal for Numerical Methods in Engineering
Imran Nasim, Michael E. Henderson
Mathematics
Jianke Yang, Robin Walters, et al.
ICML 2023