R.M. Macfarlane, R.L. Cone
Physical Review B - CMMP
The use of He-diffraction as a method in surface crystallography is briefly reviewed. To illustrate the possibilities and limitations a few examples of surface structures are presented and discussed. Current problems and future needs are outlined. © 1982 IOP Publishing Ltd.
R.M. Macfarlane, R.L. Cone
Physical Review B - CMMP
Shu-Jen Han, Dharmendar Reddy, et al.
ACS Nano
T.N. Morgan
Semiconductor Science and Technology
R.J. Gambino, N.R. Stemple, et al.
Journal of Physics and Chemistry of Solids