Investigations of silicon nano-crystal floating gate memories
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
A diamond anvil optical cell is employed to measure the pressure dependence of the fundamental indirect Γ-X transition of crystalline Si. The result is E (eV) = (1.110 ± 0.002) - (1.41 ± 0.06) × 10-3P where the pressure P is in kbar. Between 115 and 126 a transformation takes place to a phase opaque to electromagnetic radiation of wavelength between 0.3 and 2.0 μm. We believe this is the same phase transition reported by Minomura and Drickamer. A pseudopotential calculation assuming a relatively soft core is carried out and its results are in rather good agreement with experiment. © 1975.
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
J.A. Barker, D. Henderson, et al.
Molecular Physics
M.A. Lutz, R.M. Feenstra, et al.
Surface Science
Julien Autebert, Aditya Kashyap, et al.
Langmuir