R. Scheuerlein, W.J. Gallagher, et al.
ISSCC 2000
A study on the impact of environmental factors, power supply voltage and mask imperfections on the electrical performance of integrated circuits was performed. The canonical circuit composed of a source buffer driving an identical destination buffer through a length of minimum-wire width was considered. The impact of device and wire variations on the delay of the buffer/wire combination was examined. The result showed that the wire resistivity was a dominant source of delay variability and buffer insertion and wire sizing was needed to contol delay variability.
R. Scheuerlein, W.J. Gallagher, et al.
ISSCC 2000
H.P. Hofstee, Naoaki Aoki, et al.
ISSCC 2000
A.A. De Carvalho, S. Nassif, et al.
SBCCI Brazil 1998
S. Polonsky, D.R. Knebel, et al.
ISSCC 2000