R.M. Macfarlane, R.L. Cone
Physical Review B - CMMP
The use of a dedicated chamber to perform pre-epi deposition cleaning allows native oxide removal with a low thermal budget, and significantly improves throughput of low-temperature Si and SiGe applications. Wafers processed in the cleaning chamber show no detectable contaminants, and the cleansed surface is actually significantly smoother because of cleaning down to a sub-angstrom level.
R.M. Macfarlane, R.L. Cone
Physical Review B - CMMP
L.K. Wang, A. Acovic, et al.
MRS Spring Meeting 1993
J. Tersoff
Applied Surface Science
Min Yang, Jeremy Schaub, et al.
Technical Digest-International Electron Devices Meeting