E. Babich, J. Paraszczak, et al.
Microelectronic Engineering
In this study the role of anisotropy on flux penetration in c-axis epitaxial (Formula presented) and (Formula presented) films is investigated by magneto-optics. We study thin films of (Formula presented) on substrates with vicinal angles of 0° (well-oriented), (Formula presented) and (Formula presented) and (Formula presented) films as a function of chain-conduction-induced anisotropy. A crossover from fractal to nonfractal flux penetration is observed with increasing anisotropy. Numerical simulations of anisotropic flux motion are compared with experiment. © 1998 The American Physical Society.
E. Babich, J. Paraszczak, et al.
Microelectronic Engineering
B.A. Hutchins, T.N. Rhodin, et al.
Surface Science
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EMC 2011
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