PaperTransmission electron microscopy for optical storage material analysisS.R. Herd, K.Y. AhnThin Solid Films
PaperCompositional uniformity of NiSingle Bond signFe filmsK.Y. Ahn, W.R. BeamJournal of Applied Physics
Conference paperHigh-sensitivity silicide films for optical recordingK.Y. Ahn, T.H. Distefano, et al.CLEO 1982
PaperLaser writing on metal-silicon bilayers for optical storage. I. Optical propertiesK.Y. Ahn, T.H. Di Stefano, et al.Journal of Applied Physics