Microscopy and Microanalysis

Paper

03 Aug 2008

Control of parasitic aberrations in multipole corrector optics

View publication

Abstract

No abstract available.

Paper

Characterizing probe performance in the aberration corrected STEM

P.E. Batson

Ultramicroscopy

Paper

Structural and electronic characterization of a dissociated dislocation in GeSi

P.E. Batson

Physical Review B - CMMP

Paper

Surface plasmon scattering on flat surfaces at grazing incidence

P.E. Batson

Ultramicroscopy

Paper

High-energy resolution electron spectrometer for 1-nm spatial analysis

P.E. Batson

Review of Scientific Instruments

View all publications