Sonia Cafieri, Jon Lee, et al.
Journal of Global Optimization
Paper
Continuing improvements
Abstract
Many TQM initiatives fail due to a lack of commitment by management. The author suggests using an assessment framework so that every ‘benefit’ becomes visible and, therefore, encourages even more effort. © 1993, MCB UP Limited
Related
A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990
Satoshi Hada
IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
Conference paper
Characterization of a next generation step-and-scan system
Timothy J. Wiltshire, Joseph P. Kirk, et al.
SPIE Advanced Lithography 1998