Isotropic treatment of EMF effects in advanced photomasks
Jaione Tirapu Azpiroz, Alan E. Rosenbluth, et al.
SPIE Photomask Technology + EUV Lithography 2009
The random assignment problem is to choose a minimum-cost perfect matching in a complete n × n bipartite graph, whose edge weights are chosen randomly from some distribution such as the exponential distribution with mean 1. In this case it is known that the expectation does not grow unboundedly with n, but approaches some limiting value c* between 1.51 and 2. The limit is conjectured to be π2/6, while a recent conjecture is that for finite n, the expected cost is ∑ni=11/i2. This paper contains two principal results. First, by defining and analyzing a constructive algorithm, we show that the limiting expectation is c* < 1.94. Second, we extend the finite-n conjecture to partial assignments on complete m × n bipartite graphs and prove it in some limited cases. © 1999 John Wiley & Sons, Inc.
Jaione Tirapu Azpiroz, Alan E. Rosenbluth, et al.
SPIE Photomask Technology + EUV Lithography 2009
I.K. Pour, D.J. Krajnovich, et al.
SPIE Optical Materials for High Average Power Lasers 1992
Tong Zhang, G.H. Golub, et al.
Linear Algebra and Its Applications
Fausto Bernardini, Holly Rushmeier
Proceedings of SPIE - The International Society for Optical Engineering