S. Kim, J. Henderson, et al.
Thin Solid Films
Volterra edge dislocations were introduced in an amorphous Lennard-Jones model. By application of suitable boundary conditions, equivalent to a shear stress, a recognizable step with a shape of a double-headed asymptote was formed on the other side of the amorphous solid. This suggests that atomic transport via dislocation motion can occur and could be the mechanism of shear-band formation in real amorphous materials. © 1983 The American Physical Society.
S. Kim, J. Henderson, et al.
Thin Solid Films
P. Chaudhari, D. Dimos, et al.
IBM J. Res. Dev
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IEDM 2002
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IEDM 2005