H.D. Dulman, R.H. Pantell, et al.
Physical Review B
Impurities and additives used in the liquid‐phase densifica‐tiondensification of silicon nitride ceramics are preferentially partitioned to the residual intergranular glass phase remaining in these materials. On the basis of a simple phenomenological ionic migration model, it is proposed and demonstrated that a high‐temperature electrolysis treatment may be used to modify the concentration of both the additive and impurities. The compositional modification has a number of consequences and, as an illustration, the improvement in high‐frequency dielectric loss produced as a result of the electrolysis treatment is presented. Copyright © 1984, Wiley Blackwell. All rights reserved
H.D. Dulman, R.H. Pantell, et al.
Physical Review B
P.C. Pattnaik, D.M. Newns
Physical Review B
A. Gangulee, F.M. D'Heurle
Thin Solid Films
R.D. Murphy, R.O. Watts
Journal of Low Temperature Physics