The DX centre
T.N. Morgan
Semiconductor Science and Technology
Thermal decomposition of triphenyl boron vapor at 800°C produced boron-carbon thin films of composition C16-18B. The room-temperature resistivity of this material was 1.8 × 10-4 Ω· cm, considerably lower than pyrolytic carbons produced at similar temperatures. This resistivity remained unchanged as the temperature was lowered to 5 K, indicating fine-grain, metallic-like conductivity. Material composition was determined using Auger electron spectroscopy. X-ray and electron diffraction studies show that the films had a layered structure similar to turbostatic graphite and ESCA experiments indicate that the boron is bonded to carbon and is not present as a second phase. © 1994.
T.N. Morgan
Semiconductor Science and Technology
Daniel J. Coady, Amanda C. Engler, et al.
ACS Macro Letters
M.A. Lutz, R.M. Feenstra, et al.
Surface Science
R.J. Gambino, N.R. Stemple, et al.
Journal of Physics and Chemistry of Solids