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Single and dual wavelength exposure of photoresist
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Proceedings of SPIE 1989
Many numerical methods call for repeated calculation of the first partial derivatives of a given function of several variables. Errors m a program for that calculation can be hard to discover. A procedure IS offered for testing the program and locating its errors. © 1982, ACM. All rights reserved.
J. LaRue, C. Ting
Proceedings of SPIE 1989
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