Robert W. Keyes
Physical Review B
Paper
Characterization of epitaxial thin films by x-ray diffraction
Abstract
No abstract available.
Related
Paper
The DX centre
T.N. Morgan
Semiconductor Science and Technology
Julien Autebert, Aditya Kashyap, et al.
Langmuir
D.D. Awschalom, J.-M. Halbout
Journal of Magnetism and Magnetic Materials