Robert C. Durbeck
IEEE TACON
Paper
Cellular automata circuits for built-in self-test
Abstract
No abstract available.
Related
Raymond Wu, Jie Lu
ITA Conference 2007
Conference paper
Compression for data archiving and backup revisited
Corneliu Constantinescu
SPIE Optical Engineering + Applications 2009
Gal Badishi, Idit Keidar, et al.
IEEE TDSC