Paper
The DX centre
T.N. Morgan
Semiconductor Science and Technology
Paper
Capabilities and limitations of EXAFS for amorphous alloys
Abstract
This paper provides a brief overview of the use of EXAFS in investigating atomic arrangements in amorphous alloys. Comparisons are drawn between EXAFS and scattering techniques, in terms of equations used to analyze the two types of measurements and in terms of results for specific amorphous alloys. Both the promises and the problems of EXAFS for amorphous alloys are discussed. © 1984.
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