Michiel Sprik
Journal of Physics Condensed Matter
This paper provides a brief overview of the use of EXAFS in investigating atomic arrangements in amorphous alloys. Comparisons are drawn between EXAFS and scattering techniques, in terms of equations used to analyze the two types of measurements and in terms of results for specific amorphous alloys. Both the promises and the problems of EXAFS for amorphous alloys are discussed. © 1984.
Michiel Sprik
Journal of Physics Condensed Matter
Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008
P. Martensson, R.M. Feenstra
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Eloisa Bentivegna
Big Data 2022