William Hinsberg, Joy Cheng, et al.
SPIE Advanced Lithography 2010
This paper provides a brief overview of the use of EXAFS in investigating atomic arrangements in amorphous alloys. Comparisons are drawn between EXAFS and scattering techniques, in terms of equations used to analyze the two types of measurements and in terms of results for specific amorphous alloys. Both the promises and the problems of EXAFS for amorphous alloys are discussed. © 1984.
William Hinsberg, Joy Cheng, et al.
SPIE Advanced Lithography 2010
William G. Van der Sluys, Alfred P. Sattelberger, et al.
Polyhedron
D.D. Awschalom, J.-M. Halbout
Journal of Magnetism and Magnetic Materials
S.F. Fan, W.B. Yun, et al.
Proceedings of SPIE 1989