John R. Kender, Rick Kjeldsen
IEEE Transactions on Pattern Analysis and Machine Intelligence
No abstract available.
John R. Kender, Rick Kjeldsen
IEEE Transactions on Pattern Analysis and Machine Intelligence
L Auslander, E Feig, et al.
Advances in Applied Mathematics
Sankar Basu
Journal of the Franklin Institute
David L. Shealy, John A. Hoffnagle
SPIE Optical Engineering + Applications 2007