Frank Stem
C R C Critical Reviews in Solid State Sciences
Black phosphorus is a layered semiconductor that is intensely researched in view of applications in optoelectronics. In this letter, we investigate a multilayer black phosphorus photodetector that is capable of acquiring high-contrast (V > 0.9) images both in the visible (VIS = 532 nm) as well as in the infrared (IR = 1550 nm) spectral regime. In a first step, by using photocurrent microscopy, we map the active area of the device and we characterize responsivity and gain. In a second step, by deploying the black phosphorus device as a point-like detector in a confocal microsope setup, we acquire diffraction-limited optical images with submicron resolution. The results demonstrate the usefulness of black phosphorus as an optoelectronic material for hyperspectral imaging applications.
Frank Stem
C R C Critical Reviews in Solid State Sciences
Thomas H. Baum, Carl E. Larson, et al.
Journal of Organometallic Chemistry
D.D. Awschalom, J.-M. Halbout
Journal of Magnetism and Magnetic Materials
F.J. Himpsel, T.A. Jung, et al.
Surface Review and Letters