A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990
An electron microscope structure image of a Σ = 21/[111] tilt grain boundary in Au was obtained and atomic column positions identified to yield a structural unit model of the interface consisting of repeating polyhedron shapes. This result represents the smallest projected spacings at a grain boundary containing defect structures imaged by an electron microscope and interpreted atomistically. © 1990, Materials Research Society. All rights reserved.
A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990
P. Alnot, D.J. Auerbach, et al.
Surface Science
Xikun Hu, Wenlin Liu, et al.
IEEE J-STARS
P.C. Pattnaik, D.M. Newns
Physical Review B