Heinz Schmid, Hans Biebuyck, et al.
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
An electron microscope structure image of a Σ = 21/[111] tilt grain boundary in Au was obtained and atomic column positions identified to yield a structural unit model of the interface consisting of repeating polyhedron shapes. This result represents the smallest projected spacings at a grain boundary containing defect structures imaged by an electron microscope and interpreted atomistically. © 1990, Materials Research Society. All rights reserved.
Heinz Schmid, Hans Biebuyck, et al.
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
A. Reisman, M. Berkenblit, et al.
JES
Sharee J. McNab, Richard J. Blaikie
Materials Research Society Symposium - Proceedings
J. Paraszczak, J.M. Shaw, et al.
Micro and Nano Engineering