U. Dürig, G. Cross, et al.
Tribology Letters
Paper
Atomic resolution with atomic force microscope
Abstract
The atomic force microscope (AFM) is a promising new method for studying the surface structure of both conductors and insulators. In mapping a graphite surface with an insulating stylus, we have achieved a resolution better than 2.5 Å. © 1987 IOP Publishing Ltd.
Related
M. Amrein, A. Stasiak, et al.
Science
T. Schneider, E. Stoll
Ferroelectrics
Alastair D. Bruce, T. Schneider, et al.
Physical Review Letters