Conference paper
Some experimental results on placement techniques
Maurice Hanan, Peter K. Wolff, et al.
DAC 1976
A method for multilevel validation and testing of architectural timing models (timers) coded to predict cycles-per-instruction performance of CMOS RISC processors, is described. Establishment of cause and effect relationships in terms of modal defects and associated fault signatures, verification of steady-state behavior pipeline flow against analytically predicted signatures using a derived application-based test loop kernels and verification of the 'core' parameters of pipeline-level machine organization using derived synthetic test cases, are emphasized.
Maurice Hanan, Peter K. Wolff, et al.
DAC 1976
Donald Samuels, Ian Stobert
SPIE Photomask Technology + EUV Lithography 2007
Bowen Zhou, Bing Xiang, et al.
SSST 2008
David S. Kung
DAC 1998