A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990
A method for multilevel validation and testing of architectural timing models (timers) coded to predict cycles-per-instruction performance of CMOS RISC processors, is described. Establishment of cause and effect relationships in terms of modal defects and associated fault signatures, verification of steady-state behavior pipeline flow against analytically predicted signatures using a derived application-based test loop kernels and verification of the 'core' parameters of pipeline-level machine organization using derived synthetic test cases, are emphasized.
A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990
Matthias Kaiserswerth
IEEE/ACM Transactions on Networking
Frank R. Libsch, Takatoshi Tsujimura
Active Matrix Liquid Crystal Displays Technology and Applications 1997
John M. Boyer, Charles F. Wiecha
DocEng 2009