Arun Viswanathan, Nancy Feldman, et al.
IEEE Communications Magazine
A method for multilevel validation and testing of architectural timing models (timers) coded to predict cycles-per-instruction performance of CMOS RISC processors, is described. Establishment of cause and effect relationships in terms of modal defects and associated fault signatures, verification of steady-state behavior pipeline flow against analytically predicted signatures using a derived application-based test loop kernels and verification of the 'core' parameters of pipeline-level machine organization using derived synthetic test cases, are emphasized.
Arun Viswanathan, Nancy Feldman, et al.
IEEE Communications Magazine
J.P. Locquet, J. Perret, et al.
SPIE Optical Science, Engineering, and Instrumentation 1998
S. Sattanathan, N.C. Narendra, et al.
CONTEXT 2005
Sai Zeng, Angran Xiao, et al.
CAD Computer Aided Design