William Hinsberg, Joy Cheng, et al.
SPIE Advanced Lithography 2010
A method for multilevel validation and testing of architectural timing models (timers) coded to predict cycles-per-instruction performance of CMOS RISC processors, is described. Establishment of cause and effect relationships in terms of modal defects and associated fault signatures, verification of steady-state behavior pipeline flow against analytically predicted signatures using a derived application-based test loop kernels and verification of the 'core' parameters of pipeline-level machine organization using derived synthetic test cases, are emphasized.
William Hinsberg, Joy Cheng, et al.
SPIE Advanced Lithography 2010
Rafae Bhatti, Elisa Bertino, et al.
Communications of the ACM
Zohar Feldman, Avishai Mandelbaum
WSC 2010
A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990