Scripta Metallurgica

Paper

01 Jan 1987

Application of direct and indirect methods to the study of crystallization of amorphous Cr₅Si₃

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Abstract

No abstract available.

Paper

Contact for shallow junctions

K.N. Tu

Thin Solid Films

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AES and EELS study of ErSi₂ and its behaviour under ion bombardment and oxygen exposure

S. Valeri, U. del Pennino, et al.

Solid State Communications

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Thermal stability of Pd₂Si and PdSi in thin film and in bulk diffusion couples

K.N. Tu

Journal of Applied Physics

Paper

Diffusion of arsenic along dislocations in epitaxial silicon films

David R. Campbell, K.N. Tu, et al.

Thin Solid Films

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