Angle-of-incidence dependence of photoemission of a localized electron from a jellium solid

We show via a calculation for a localized electron in a jellium solid that an escape-cone mechanism accounts for a significant component of the peak seen by Rowe and Christman in photoyield data as a function of angle of incidence for Ar embedded in Ge(111) and Si(111) surfaces. © 1976 The American Physical Society.