Hans Becker, Frank Schmidt, et al.
Photomask and Next-Generation Lithography Mask Technology 2004
An efficient algorithm searching for the best (shortened) cyclic burst-correcting codes is presented. The efficiency of the algorithm stems from the fact that no repeated syndromes are computed. It is shown how to achieve this goal by using Gray codes. © 2006 IEEE.
Hans Becker, Frank Schmidt, et al.
Photomask and Next-Generation Lithography Mask Technology 2004
Victor Valls, Panagiotis Promponas, et al.
IEEE Communications Magazine
G. Ramalingam
Theoretical Computer Science
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I-SPAN 2002