Min Yang, Jeremy Schaub, et al.
Technical Digest-International Electron Devices Meeting
The fabrication and application of photoplastic scanning force microscopy (SFM) probes has been demonstrated. Simple molding and replication techniques, inexpensive photoplastic material, reusable molds and several layers per probe make it a very attractive for fabricating low-cost photoplastic SFM probes. The good homogeneity of the cantilevers within a cassette and among cassettes over a 4 in. wafer coupled with an appropriate holder provides ease of operation.
Min Yang, Jeremy Schaub, et al.
Technical Digest-International Electron Devices Meeting
Frank Stem
C R C Critical Reviews in Solid State Sciences
Corneliu Constantinescu
SPIE Optical Engineering + Applications 2009
I.K. Pour, D.J. Krajnovich, et al.
SPIE Optical Materials for High Average Power Lasers 1992