Conference paper
Modeling polarization for Hyper-NA lithography tools and masks
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007
We consider conditions that have appeared in the literature with the purpose of defining a "good" decomposition of a relation scheme. We show that these notions are equivalent in the case that all constraints in the database are functional dependencies. This result solves an open problem of Rissanen. However, for arbitrary constraints the notions are shown to differ. © 1980.
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007
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Journal of Computer and System Sciences
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ISIT 2005
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