Silicon photonics and challenges for fabrication
N. Feilchenfeld, Karen Nummy, et al.
SPIE Advanced Lithography 2017
Parasitic fringe drift from unwanted scatterings limits the long-term stability of waveguide-based optical spectrometers. Yet their spectral features provide relevant information that can be used to improve performance of the spectrometer. We show that fringe drift can be extracted and utilized to perform accurate thermal stabilization, especially in the case of integrated waveguide sensors. In this Letter, effective stabilization of a methane silicon photonic sensor is demonstrated, and significant reduction in fringe noise is clearly observed.
N. Feilchenfeld, Karen Nummy, et al.
SPIE Advanced Lithography 2017
Eric J. Zhang, Chu C. Teng, et al.
Sensors (Switzerland)
Eric J. Zhang, Yves Martin, et al.
SPIE DCS 2019
Eric J. Zhang, Srikanth Srinivasan, et al.
Science Advances