Conference paper
Low temperature SER and noise in a high speed DRAM
W.H. Henkels, N.C.-C. Lu, et al.
Workshop on Low Temperature Semiconductor Electronics 1989
Paper
Accurate measurement of small inductances or penetration depths in superconductors
Abstract
A technique for accurately measuring small superconductive inductances is presented. The inductance to be measured is inserted into a two-junction interferometer into which control current is directly injected. The method was used to measure the penetration depth of a Pb-In-Au alloy film and the effect of magnetic field fringing into a narrow superconductive stripline.
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Experimental 27 ns 1 Mb CMOS high-speed DRAM
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