Conference paper
Characterization of line width variation
Alfred K. Wong, Antoinette F. Molless, et al.
SPIE Advanced Lithography 2000
Paper
A very fast shift-register sequence random number generator
Abstract
No abstract available.
Related
James Lee Hafner
Journal of Number Theory
Conference paper
Distilling common randomness from bipartite quantum states
Igor Devetak, Andreas Winter
ISIT 2003
Ronen Feldman, Martin Charles Golumbic
Ann. Math. Artif. Intell.