F. Odeh, I. Tadjbakhsh
Archive for Rational Mechanics and Analysis
Paper
A rational approximation to the logarithm
Related
Conference paper
Characterization of line width variation
Alfred K. Wong, Antoinette F. Molless, et al.
SPIE Advanced Lithography 2000
Ronen Feldman, Martin Charles Golumbic
Ann. Math. Artif. Intell.
John S. Lew
Mathematical Biosciences