Y.Y. Li, K.S. Leung, et al.
J Combin Optim
No abstract available.
Y.Y. Li, K.S. Leung, et al.
J Combin Optim
Moutaz Fakhry, Yuri Granik, et al.
SPIE Photomask Technology + EUV Lithography 2011
Sonia Cafieri, Jon Lee, et al.
Journal of Global Optimization
F. Odeh, I. Tadjbakhsh
Archive for Rational Mechanics and Analysis