Conference paper
Modeling polarization for Hyper-NA lithography tools and masks
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007
Paper
A note on monte carlo primality tests and algorithmic information theory
Abstract
No abstract available.
Related
Heinz Koeppl, Marc Hafner, et al.
BMC Bioinformatics
Leo Liberti, James Ostrowski
Journal of Global Optimization
I.K. Pour, D.J. Krajnovich, et al.
SPIE Optical Materials for High Average Power Lasers 1992